Each new semiconductor process node represents exciting opportunities for suppliers of design, manufacturing, test, and failure analysis solutions. A new process means new challenges to solve, and ...

Scan diagnosis is an established method for identifying and locating semiconductor defects on devices that fail manufacturing test and on field returns. Effectively selecting the right devices for ...

Engineers setting up a new surface-mount assembly line or modifying an existing line generally try to create a sequence of production processes that will successfully assemble the components while ...

As advances in IC technology have resulted in geometry and process variations, manufacturers have encountered a drop in both initial and mature yield and an increase in yield ramp-up time. Systematic ...