Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
Electron diffraction is a powerful analytical technique used to study the atomic structure of materials. It involves the interaction of a beam of electrons with a crystalline sample, resulting in a ...
insights from industryFernando C. Castro, Ph.D.Applications ScientistGatan In this interview, Fernando C. Castro, Ph.D., an Applications Scientist at Gatan, talks to AZoMaterials about the new ...
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