Electron microscopy (EM) has become an indispensable tool for investigating the nanoscale structure of a large range of materials, across physical and life sciences. It is vital for characterisation ...
A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...
Attending the RAISe+ Scheme Signing Ceremony are Professor Chen Fu-Rong (2nd left) and his research team members: Professor Hsueh Yu-Chun (1st left), Dr Chen Yan (2nd right) and Mr Chen Yuchi (1st ...
A team of researchers has developed the first transmission electron microscope which operates at the temporal resolution of a single attosecond, allowing for the first still-image of an electron in ...
Transmission Electron Microscopes can be used for a variety of different techniques, which set them apart from other forms of microscope. The first is metal shadowing or negative staining. TEM ...
The high sensitivity of the reflection electron microscopy (REM) technique to small changes in the crystal structure and composition of the top surface layers of various crystalline materials makes it ...
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