“Low Energy Ion Scattering Spectroscopy (LEIS) can provide the elemental composition of the outermost atomic layer of a material by probing it with a 1 – 10 keV beam of noble gas ions. There isn’t ...
insights from industryTim Nunney Applications Development & Marketing Manager Surface Analysis & Microanalysis In this interview, AZoM talks to Tim Nunney, Applications Development & Marketing Manager ...
The multi-mode gas cluster ion source (GCIS) is designed to operate in both Ar n + cluster and Ar + monatomic modes making it suitable for sputter cleaning and depth profiling organic, inorganic and ...
Description: Introduction to the application of ion and electron beams in the chemical analysis of gases and of surfaces. Emphasis is on the unity of the phenomena that underlie the preparation, ...
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