The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...