TESCAN AMBER is designed with a focus on versatility, covering both sample characterization at the nanoscale, and everyday FIB applications in the materials research lab. The synergy of its field free ...
insights from industryDr. Anna WalkiewiczApplications SpecialistQuorum Technologies In this interview, AZoM talks to Anna Walkiewicz, Applications Specialist at Quorum Technologies, about sample ...
Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...
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When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
Prepare samples by coating, drying, etching, milling, polishing, and sectioning. The Leica CPD 030 Critical Point Dryer is a critical point drying device for biological and industrial samples. It uses ...
Prepare samples by coating, drying, etching, milling, polishing, and sectioning. The Leica CPD 030 Critical Point Dryer is a critical point drying device for biological and industrial samples. It uses ...
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